{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11288491","patent":{"patent_number":"US-11288491","title":"Method for automated unsupervised ontological investigation of structural appearances in electron micrographs","assignee":null,"inventors":[],"filing_date":"2018-07-02T00:00:00.000Z","publication_date":"2022-03-29T00:00:00.000Z","cpc_codes":["G06V","G06V","G06V","G06V"],"num_claims":6,"abstract":"The method is for dividing dark objects, sub-structures and background of an image from an electron microscope into segments by analyzing pixel values. The segments are transformed and aligned so that the transformed objects, sub-structures and background are meaningfully comparable. The transformed segments are clustered into classes which are used for ontological investigation of samples that are visualized by using electron microscopy. A triangle inequality comparison can be used to further cluster groups of objects to transfer understanding from different interactions between objects and to associate interactions with each other."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for automated unsupervised ontological investigation of structural appearances in electron micrographs","description":"The method is for dividing dark objects, sub-structures and background of an image from an electron microscope into segments by analyzing pixel values. The segments are transformed and aligned so that","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11288491","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11288491","citation_suggestion":"Patentable. \"Method for automated unsupervised ontological investigation of structural appearances in electron micrographs\" (US-11288491). https://patentable.app/patents/US-11288491","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11288491","json":"https://patentable.app/api/llm-context/US-11288491","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T07:35:02.614Z"}