{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11289385","patent":{"patent_number":"US-11289385","title":"Semiconductor die and a method for detecting an edge crack in a semiconductor die","assignee":null,"inventors":[],"filing_date":"2020-06-09T00:00:00.000Z","publication_date":"2022-03-29T00:00:00.000Z","cpc_codes":["H01L","H01L","H01L","H01L"],"num_claims":14,"abstract":"A semiconductor die including a crack stop structure, at least one edge seal structure and a selector circuit is provided. The crack stop structure is located in a periphery region of the semiconductor die. The crack stop structure is biased by a first voltage. The edge seal structure is located between the crack stop structure and an integrated circuit region of the semiconductor die. The edge seal structure is biased by the first voltage in a normal mode and is biased by a second voltage different from the first voltage in a test mode. The selector circuit receives the first voltage, the second voltage and a control signal for placing the semiconductor die in the normal mode or the test mode, and selects and outputs one of the first voltage and the second voltage to the edge seal structure according to the control signal."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor die and a method for detecting an edge crack in a semiconductor die","description":"A semiconductor die including a crack stop structure, at least one edge seal structure and a selector circuit is provided. The crack stop structure is located in a periphery region of the semiconducto","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11289385","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11289385","citation_suggestion":"Patentable. \"Semiconductor die and a method for detecting an edge crack in a semiconductor die\" (US-11289385). https://patentable.app/patents/US-11289385","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11289385","json":"https://patentable.app/api/llm-context/US-11289385","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T15:31:47.815Z"}