{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11300521","patent":{"patent_number":"US-11300521","title":"Automatic defect classification","assignee":null,"inventors":[],"filing_date":"2018-06-14T00:00:00.000Z","publication_date":"2022-04-12T00:00:00.000Z","cpc_codes":["G01N","G06T","G01N","G06T","G06T","G06T","G01N","G01N","G01N","G01N","G06T","G06T","G06T","G06T"],"num_claims":23,"abstract":"A method for automatic defect classification, the method may include (i) acquiring, by a first camera, at least one first image of at least one area of an object; (ii) processing the at least one first image to detect a group of suspected defects within the at least one area; (iii) performing a first classification process for initially classifying the group of suspected defects; (iii) determining whether a first subgroup of the suspected defects requires additional information from a second camera for a completion of a classification; (iv) when determining that the first subgroup of the suspected defects requires additional information from the second camera then: (a) acquiring second images, by the second camera, of the first subgroup of the suspected defects; and (b) performing a second classification process for classifying the first subgroup of suspected defects."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Automatic defect classification","description":"A method for automatic defect classification, the method may include (i) acquiring, by a first camera, at least one first image of at least one area of an object; (ii) processing the at least one firs","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11300521","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11300521","citation_suggestion":"Patentable. \"Automatic defect classification\" (US-11300521). https://patentable.app/patents/US-11300521","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11300521","json":"https://patentable.app/api/llm-context/US-11300521","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T11:54:53.319Z"}