{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11301748","patent":{"patent_number":"US-11301748","title":"Automatic feature extraction from aerial images for test pattern sampling and pattern coverage inspection for lithography","assignee":null,"inventors":[],"filing_date":"2018-11-13T00:00:00.000Z","publication_date":"2022-04-12T00:00:00.000Z","cpc_codes":["G06T","G06F","G06N","G06N","G06N","G06N","G06T","G06T","G06V","G06V","G06V","G06V","G06V","G06V","G06F","G06T","G06T","G06T"],"num_claims":20,"abstract":"According to one or more embodiments of the present invention a computer-implemented method for fabricating a chip includes generating, using an aerial image generation system, a set of aerial images for a chip layout, the set of aerial images including an aerial image corresponding to each region from the chip layout. The method further includes automatically determining, using an artificial neural network, a feature vector for each aerial image from the set of aerial images. The method further includes clustering the aerial images using their corresponding feature vectors. The method further includes selecting, as test samples, a predetermined number of aerial images from each cluster. The method further includes performing a pattern coverage inspection of the chip layout using the aerial images that are selected as test samples."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Automatic feature extraction from aerial images for test pattern sampling and pattern coverage inspection for lithography","description":"According to one or more embodiments of the present invention a computer-implemented method for fabricating a chip includes generating, using an aerial image generation system, a set of aerial images ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11301748","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11301748","citation_suggestion":"Patentable. \"Automatic feature extraction from aerial images for test pattern sampling and pattern coverage inspection for lithography\" (US-11301748). https://patentable.app/patents/US-11301748","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11301748","json":"https://patentable.app/api/llm-context/US-11301748","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T11:13:04.513Z"}