{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11307219","patent":{"patent_number":"US-11307219","title":"Method and system for analyzing spatial resolution of microwave near-field probe and microwave microscope equipped with the system","assignee":null,"inventors":[],"filing_date":"2021-04-12T00:00:00.000Z","publication_date":"2022-04-19T00:00:00.000Z","cpc_codes":["G06F"],"num_claims":7,"abstract":"The present disclosure relates to the technical field of microwave test, and discloses a method and a system for analyzing the spatial resolution of a microwave near-field probe and a microwave microscope equipped with the system, wherein in the method for analyzing the spatial resolution of the microwave near-field probe, a three-dimensional equipotential surface in a sample is drawn by using an electric field formula calculated by a quasi-static theory; an equivalent model of a probe sample is established by using finite element analysis software, so as to change material characteristics in the area outside the three-dimensional equipotential surface; by observing the influence of changing materials on the potential distribution in the sample, a near-field action range of the probe is determined, and the spatial resolution of the microwave near-field scanning microscope is analyzed and calculated."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method and system for analyzing spatial resolution of microwave near-field probe and microwave microscope equipped with the system","description":"The present disclosure relates to the technical field of microwave test, and discloses a method and a system for analyzing the spatial resolution of a microwave near-field probe and a microwave micros","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11307219","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11307219","citation_suggestion":"Patentable. \"Method and system for analyzing spatial resolution of microwave near-field probe and microwave microscope equipped with the system\" (US-11307219). https://patentable.app/patents/US-11307219","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11307219","json":"https://patentable.app/api/llm-context/US-11307219","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T04:00:07.322Z"}