{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11307245","patent":{"patent_number":"US-11307245","title":"Method for measuring an electric property of a test sample","assignee":null,"inventors":[],"filing_date":"2020-03-18T00:00:00.000Z","publication_date":"2022-04-19T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C"],"num_claims":14,"abstract":"The method may be used for measuring an electric property of a magnetic tunnel junction used in an embedded MRAM memory for example. The method uses a multi point probe with a plurality of probe tips for contacting a designated area of the test sample, which is electrically insulated from the part of the test sample which is to be tested. Electrically connections are placed underneath the magnetic tunnel junction and goes to the designated area."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for measuring an electric property of a test sample","description":"The method may be used for measuring an electric property of a magnetic tunnel junction used in an embedded MRAM memory for example. The method uses a multi point probe with a plurality of probe tips ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11307245","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11307245","citation_suggestion":"Patentable. \"Method for measuring an electric property of a test sample\" (US-11307245). https://patentable.app/patents/US-11307245","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11307245","json":"https://patentable.app/api/llm-context/US-11307245","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T15:32:47.300Z"}