{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11307919","patent":{"patent_number":"US-11307919","title":"Fail information control circuit, semiconductor apparatus including the same, and fail information control method of semiconductor apparatus","assignee":null,"inventors":[],"filing_date":"2019-12-10T00:00:00.000Z","publication_date":"2022-04-19T00:00:00.000Z","cpc_codes":["G06F","G06F","G06F","G06F","G06F","G06F","G06F"],"num_claims":17,"abstract":"A fail information control circuit may include: a comparison circuit configured to generate a comparison result signal by comparing read data and write data; a fail bit discrimination circuit configured to generate a first fail discrimination signal for discriminating a fail detected when the write data has a first value and a second fail discrimination signal for discriminating a fail detected when the write data has a second value, in response to the comparison result signal; and a fail bit counter configured to generate a first counting signal by counting the first fail discrimination signal and generate a second counting signal by counting the second fail discrimination signal."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Fail information control circuit, semiconductor apparatus including the same, and fail information control method of semiconductor apparatus","description":"A fail information control circuit may include: a comparison circuit configured to generate a comparison result signal by comparing read data and write data; a fail bit discrimination circuit configur","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11307919","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11307919","citation_suggestion":"Patentable. \"Fail information control circuit, semiconductor apparatus including the same, and fail information control method of semiconductor apparatus\" (US-11307919). https://patentable.app/patents/US-11307919","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11307919","json":"https://patentable.app/api/llm-context/US-11307919","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T14:11:03.597Z"}