{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11308606","patent":{"patent_number":"US-11308606","title":"Design-assisted inspection for DRAM and 3D NAND devices","assignee":null,"inventors":[],"filing_date":"2019-08-16T00:00:00.000Z","publication_date":"2022-04-19T00:00:00.000Z","cpc_codes":["G06T","G01N","G01N","G06T","G06T"],"num_claims":8,"abstract":"With the disclosed systems and methods for DRAM and 3D NAND inspection, an image of the wafer is received based on the output for an inspection tool. Geometric measurements of a design of a plurality of memory devices on the wafer are received. A care area with higher inspection sensitivity is determined based on the geometric measurements."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Design-assisted inspection for DRAM and 3D NAND devices","description":"With the disclosed systems and methods for DRAM and 3D NAND inspection, an image of the wafer is received based on the output for an inspection tool. Geometric measurements of a design of a plurality ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11308606","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11308606","citation_suggestion":"Patentable. \"Design-assisted inspection for DRAM and 3D NAND devices\" (US-11308606). https://patentable.app/patents/US-11308606","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11308606","json":"https://patentable.app/api/llm-context/US-11308606","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T18:15:05.963Z"}