{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11462290","patent":{"patent_number":"US-11462290","title":"Wafer acceptance test module and method for a static memory function test","assignee":null,"inventors":[],"filing_date":"2020-06-15T00:00:00.000Z","publication_date":"2022-10-04T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C","G11C","G11C","G11C","G11C"],"num_claims":9,"abstract":"The disclosure discloses a wafer acceptance test module for a static memory function test, reduced instruction built-in self-test circuit formed on a wafer includes: a ring oscillator, a frequency divider, a counter, a data latch and comparator. The counter is used for count, and the count is used as an input signal of each of an address decoder and a data input port at the same time. The data latch and comparator is connected to an output terminal of the address decoder and an output terminal of the sense amplifier and compare two output signals to obtain a test result. The disclosure also discloses a wafer acceptance test method for a static memory function test. The disclosure does not need to rely on a dedicated test machine for memory to perform a static memory function test, which can simplify a test procedure."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Wafer acceptance test module and method for a static memory function test","description":"The disclosure discloses a wafer acceptance test module for a static memory function test, reduced instruction built-in self-test circuit formed on a wafer includes: a ring oscillator, a frequency div","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11462290","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11462290","citation_suggestion":"Patentable. \"Wafer acceptance test module and method for a static memory function test\" (US-11462290). https://patentable.app/patents/US-11462290","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11462290","json":"https://patentable.app/api/llm-context/US-11462290","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T23:54:49.480Z"}