{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11463173","patent":{"patent_number":"US-11463173","title":"Systems and methods for wafer-level testing of transmitter-receiver links","assignee":null,"inventors":[],"filing_date":"2021-07-26T00:00:00.000Z","publication_date":"2022-10-04T00:00:00.000Z","cpc_codes":["H04B"],"num_claims":20,"abstract":"An integrated transceiver chip comprising: a plurality of bidirectional ports; a plurality of grating couplers; a receiver having a first and a second input ports, the first input port being optically connected to a first grating coupler of the plurality of grating couplers, and the second input port being optically connected to a first bidirectional port of the plurality of bidirectional ports; and a transmitter having a first and a second input and a first and a second output ports, the first input port being optically connected to a second bidirectional port of the plurality of bidirectional ports and the second input port being optically connected to a second grating coupler, and the first output port being optically connected to a third bidirectional port of the plurality of bidirectional ports and the second output port being optically connected to a third grating coupler of the plurality of grating couplers."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Systems and methods for wafer-level testing of transmitter-receiver links","description":"An integrated transceiver chip comprising: a plurality of bidirectional ports; a plurality of grating couplers; a receiver having a first and a second input ports, the first input port being optically","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11463173","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11463173","citation_suggestion":"Patentable. \"Systems and methods for wafer-level testing of transmitter-receiver links\" (US-11463173). https://patentable.app/patents/US-11463173","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11463173","json":"https://patentable.app/api/llm-context/US-11463173","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T07:16:19.105Z"}