{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11467133","patent":{"patent_number":"US-11467133","title":"Microtexture region characterization systems and methods","assignee":null,"inventors":[],"filing_date":"2020-03-13T00:00:00.000Z","publication_date":"2022-10-11T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N"],"num_claims":20,"abstract":"The present disclosure provides methods and systems for the characterization of a potential microtexture region (MTR) of a sample, component, or the like. The methods may include determining a threshold width of spatial correlation coefficient and/or a threshold spatial correlation coefficient slope for an actual MTR, characterizing a potential MTR as an actual MTR or a defect, characterizing an actual MTR as an acceptable MTR or not, and/or characterizing various components with potential MTRs as defective or not. The characterization may include calculating a width of spatial correlation coefficient and/or a spatial correlation coefficient slope of the potential MTR and comparing the width of spatial correlation coefficient to a threshold width of spatial correlation coefficient and/or comparing the spatial correlation coefficient slope to a threshold spatial correlation coefficient slope for the potential MTR to be characterized as an actual MTR or a defect (crack)."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Microtexture region characterization systems and methods","description":"The present disclosure provides methods and systems for the characterization of a potential microtexture region (MTR) of a sample, component, or the like. The methods may include determining a thresho","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11467133","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11467133","citation_suggestion":"Patentable. \"Microtexture region characterization systems and methods\" (US-11467133). https://patentable.app/patents/US-11467133","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11467133","json":"https://patentable.app/api/llm-context/US-11467133","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T16:56:06.586Z"}