{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11467830","patent":{"patent_number":"US-11467830","title":"Method of testing one or more compute units","assignee":null,"inventors":[],"filing_date":"2021-01-29T00:00:00.000Z","publication_date":"2022-10-11T00:00:00.000Z","cpc_codes":["G06F","G06F","G06F","G06F","G06F","G06F","G06F","G06F","G06F","G06N","G06N","G06N"],"num_claims":11,"abstract":"A processor is described that includes a plurality of compute units. One or more test pattern generators generates one or more test patterns and inputs the one or more test patterns into one or more of the plurality of compute units during testing, which testing includes processing of the one or more test patterns by one or more of the plurality of compute units. One or more control and sequencing logic units identifies an idle period during normal use of the processor in which a compute unit of the plurality of compute units is idle. The one or more control and sequencing units controls the test pattern generator to generate and input the one or more test patterns to the idle compute unit and controls the compute unit to process the one or more test patterns during the idle period. One or more comparators compares a result of testing with an expected result of testing to determine if the compute unit is functioning correctly."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method of testing one or more compute units","description":"A processor is described that includes a plurality of compute units. One or more test pattern generators generates one or more test patterns and inputs the one or more test patterns into one or more o","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11467830","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11467830","citation_suggestion":"Patentable. \"Method of testing one or more compute units\" (US-11467830). https://patentable.app/patents/US-11467830","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11467830","json":"https://patentable.app/api/llm-context/US-11467830","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T06:23:33.031Z"}