{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11468556","patent":{"patent_number":"US-11468556","title":"Artificial intelligence identified measuring method for a semiconductor image","assignee":null,"inventors":[],"filing_date":"2021-02-25T00:00:00.000Z","publication_date":"2022-10-11T00:00:00.000Z","cpc_codes":["G06T","G06F","G06F","G06N","G06T","G06T","G06V","G06N","G06N","G06T","G06T","G06T","G06V"],"num_claims":15,"abstract":"This inventions provides an artificial intelligence (A.I.) identified measuring method for a semiconductor image, comprising the steps of: providing an original image of a semiconductor; identifying a type and/or a category of the original image by an artificial intelligence; introducing a predetermined dimension measuring mode corresponding to the identified type and/or the identified category to scan the original image to generate a measurement signal of the original image; and extracting a designated object from the original image to generate a specific physical parameter of the original image after operation based on a measurement signal of the designated object and the measurement signal of the original image."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Artificial intelligence identified measuring method for a semiconductor image","description":"This inventions provides an artificial intelligence (A.I.) identified measuring method for a semiconductor image, comprising the steps of: providing an original image of a semiconductor; identifying a","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11468556","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11468556","citation_suggestion":"Patentable. \"Artificial intelligence identified measuring method for a semiconductor image\" (US-11468556). https://patentable.app/patents/US-11468556","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11468556","json":"https://patentable.app/api/llm-context/US-11468556","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T17:09:12.149Z"}