{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11472115","patent":{"patent_number":"US-11472115","title":"In-situ monitoring system assisted material and parameter development for additive manufacturing","assignee":null,"inventors":[],"filing_date":"2019-03-21T00:00:00.000Z","publication_date":"2022-10-18T00:00:00.000Z","cpc_codes":["B33Y","B33Y","B33Y","B33Y","B33Y","G05B"],"num_claims":20,"abstract":"According to some embodiments, system and methods are provided comprising receiving, via a communication interface of a parameter development module comprising a processor, a defined geometry for one or more parts, wherein the parts are manufactured with an additive manufacturing machine, and wherein a stack is formed from one or more parts; fabricating the one or more parts with the additive manufacturing machine based on a first parameter set; collecting in-situ monitoring data from one or more in-situ monitoring systems of the additive manufacturing machine for one or more parts; determining whether each stack should receive an additional part based on an analysis of the collected in-situ monitoring data; and fabricating each additional part based on the determination the stack should receive the additional part. Numerous other aspects are provided."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"In-situ monitoring system assisted material and parameter development for additive manufacturing","description":"According to some embodiments, system and methods are provided comprising receiving, via a communication interface of a parameter development module comprising a processor, a defined geometry for one ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11472115","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11472115","citation_suggestion":"Patentable. \"In-situ monitoring system assisted material and parameter development for additive manufacturing\" (US-11472115). https://patentable.app/patents/US-11472115","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11472115","json":"https://patentable.app/api/llm-context/US-11472115","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T01:54:50.982Z"}