{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11474083","patent":{"patent_number":"US-11474083","title":"Metrology qualification of non-destructive inspection systems","assignee":null,"inventors":[],"filing_date":"2020-01-03T00:00:00.000Z","publication_date":"2022-10-18T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N"],"num_claims":20,"abstract":"A method for performing metrology qualification of a non-destructive inspection (NDI) ultrasonic system includes performing, by the NDI ultrasonic system, an ultrasonic scanning operation on a calibration coupon. The ultrasonic scanning operation generates a scan signal. The method also includes superimposing a time-domain qualification mask on the scan signal and determining whether the scan signal is within the time-domain qualification mask. The method also includes validating a porosity sensitivity of the NDI ultrasonic system using a frequency-domain qualification mask. The method additionally includes qualifying the NDI ultrasonic system in response to the scan signal being within the time-domain qualification mask for a portion of the calibration coupon without a defect and the scan signal being above the time-domain qualification mask for another portion of the calibration coupon including the defect, and the porosity sensitivity of the NDI ultrasonic system being validated."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Metrology qualification of non-destructive inspection systems","description":"A method for performing metrology qualification of a non-destructive inspection (NDI) ultrasonic system includes performing, by the NDI ultrasonic system, an ultrasonic scanning operation on a calibra","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11474083","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11474083","citation_suggestion":"Patentable. \"Metrology qualification of non-destructive inspection systems\" (US-11474083). https://patentable.app/patents/US-11474083","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11474083","json":"https://patentable.app/api/llm-context/US-11474083","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T18:51:02.953Z"}