{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11474209","patent":{"patent_number":"US-11474209","title":"Distance measurement using high density projection patterns","assignee":null,"inventors":[],"filing_date":"2020-03-16T00:00:00.000Z","publication_date":"2022-10-18T00:00:00.000Z","cpc_codes":["G01S","G01S","G01S","G01S"],"num_claims":20,"abstract":"An example method includes causing a light projecting system of a distance sensor to project a pattern of light onto an object. The pattern of light includes a plurality projection artifacts arranged in a grid. Rows and columns of the grid are arranged in a staggered manner. Spacing between the rows and spacing between the columns is set so that a pattern density parameter of the pattern of light increases with a length of a trajectory of the projection artifacts. The pattern density parameter is defined as a ratio between a maximum diameter of the projection artifacts and the length of the trajectory. The method further includes causing a light receiving system of the distance sensor to acquire an image of the pattern of light projected onto the object, and computing a distance from the object to the distance sensor based on locations of the projection artifacts in the image."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Distance measurement using high density projection patterns","description":"An example method includes causing a light projecting system of a distance sensor to project a pattern of light onto an object. The pattern of light includes a plurality projection artifacts arranged ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11474209","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11474209","citation_suggestion":"Patentable. \"Distance measurement using high density projection patterns\" (US-11474209). https://patentable.app/patents/US-11474209","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11474209","json":"https://patentable.app/api/llm-context/US-11474209","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T22:14:39.205Z"}