{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11475032","patent":{"patent_number":"US-11475032","title":"Analyzing multidimensional process traces under edit-distance constraint","assignee":null,"inventors":[],"filing_date":"2019-03-13T00:00:00.000Z","publication_date":"2022-10-18T00:00:00.000Z","cpc_codes":["G06F","G06F","G06F","G06F","G06F"],"num_claims":16,"abstract":"A method, system and computer program product for analyzing multidimensional data are disclosed. In embodiments, the method comprises obtaining an original set of data having a sequential order and multiple original dimensions; selecting a topic-based summarization scheme to summarize the original set of data; and applying the selected topic-based summarization scheme to the original set of data to transform the original set of data into a new set of data having fewer dimensions than the original set of data, while preserving, within a defined measure, the sequential order of the original set of data. In embodiments, the selecting a topic-based summarization scheme includes selecting a plurality of topics, each of the topic representing a set of the original dimensions. In embodiments, the applying the topic-based summarization scheme includes performing dimensionality reduction on the original set of data to transform the original dimensions to the topics."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Analyzing multidimensional process traces under edit-distance constraint","description":"A method, system and computer program product for analyzing multidimensional data are disclosed. In embodiments, the method comprises obtaining an original set of data having a sequential order and mu","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11475032","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11475032","citation_suggestion":"Patentable. \"Analyzing multidimensional process traces under edit-distance constraint\" (US-11475032). https://patentable.app/patents/US-11475032","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11475032","json":"https://patentable.app/api/llm-context/US-11475032","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T21:22:37.539Z"}