{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11477388","patent":{"patent_number":"US-11477388","title":"Automated application of drift correction to sample studied under electron microscope","assignee":null,"inventors":[],"filing_date":"2021-12-08T00:00:00.000Z","publication_date":"2022-10-18T00:00:00.000Z","cpc_codes":["H04N","G06T","G06T","G06T"],"num_claims":20,"abstract":"Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Automated application of drift correction to sample studied under electron microscope","description":"Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observatio","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11477388","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11477388","citation_suggestion":"Patentable. \"Automated application of drift correction to sample studied under electron microscope\" (US-11477388). https://patentable.app/patents/US-11477388","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11477388","json":"https://patentable.app/api/llm-context/US-11477388","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T17:29:32.576Z"}