{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11480531","patent":{"patent_number":"US-11480531","title":"Automatic assessment method and assessment system thereof for yield improvement","assignee":null,"inventors":[],"filing_date":"2019-12-24T00:00:00.000Z","publication_date":"2022-10-25T00:00:00.000Z","cpc_codes":["G01N","G01N","G06Q","G06T"],"num_claims":20,"abstract":"An assessment system includes a storage device and a processing circuit. The processing circuit is coupled to the storage device and configured to execute the instructions stored in the storage device. The storage device is configured for storing instructions of extracting at least one feature parameter corresponding to at least one defect detected on an object respectively; determining at least one feature evaluation according to the at least one feature parameter respectively; weighting the at least one feature evaluation to calculate at least one weighted feature evaluation respectively; summing the at least one weighted feature evaluation to calculate at least one total score corresponding to at least one lesson-learnt case; and ranking the at least one total score corresponding to the at least one lesson-learnt case to find out a suspected root cause corresponding to one of the at least one lesson-learnt case with higher priority."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Automatic assessment method and assessment system thereof for yield improvement","description":"An assessment system includes a storage device and a processing circuit. The processing circuit is coupled to the storage device and configured to execute the instructions stored in the storage device","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11480531","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11480531","citation_suggestion":"Patentable. \"Automatic assessment method and assessment system thereof for yield improvement\" (US-11480531). https://patentable.app/patents/US-11480531","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11480531","json":"https://patentable.app/api/llm-context/US-11480531","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T11:56:03.544Z"}