{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11482297","patent":{"patent_number":"US-11482297","title":"Test method for self-refresh frequency of memory array and memory array test device","assignee":null,"inventors":[],"filing_date":"2021-06-08T00:00:00.000Z","publication_date":"2022-10-25T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C","G11C","G11C","G11C"],"num_claims":10,"abstract":"Disclosed are a test method for self-refresh frequency of a memory array and a memory array test device. The test method includes: providing a memory array; determining a shortest duration for charge in memory cells of the memory array to leak off, and marking the shortest duration as a first duration; setting an auto-refresh cycle of the memory array according to the first duration, where the auto-refresh cycle is longer than the first duration; performing m tests, where an nth test includes sequentially performing the following: refresh position count resetting, writing preset data to the memory array, performing a self-refresh having a duration of Tn, performing an auto-refresh having a duration of one auto-refresh cycle, reading the memory array, and recording a read status, where Tn−1<Tn, and 2≤n≤m."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Test method for self-refresh frequency of memory array and memory array test device","description":"Disclosed are a test method for self-refresh frequency of a memory array and a memory array test device. The test method includes: providing a memory array; determining a shortest duration for charge ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11482297","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11482297","citation_suggestion":"Patentable. \"Test method for self-refresh frequency of memory array and memory array test device\" (US-11482297). https://patentable.app/patents/US-11482297","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11482297","json":"https://patentable.app/api/llm-context/US-11482297","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T18:50:25.208Z"}