{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11486831","patent":{"patent_number":"US-11486831","title":"Specimen measurement device and control method of specimen measurement device","assignee":null,"inventors":[],"filing_date":"2020-07-28T00:00:00.000Z","publication_date":"2022-11-01T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N","G01N","G01N","G01N"],"num_claims":13,"abstract":"A specimen measurement device which detects a measurement object material according to the present embodiment, includes: a magnetic field applicator configured to apply a magnetic field to a measurement cartridge including a substrate, a first substance fixed on the substrate and specifically reacting with the measurement object material, a magnetic particle, and a substance fixed on the magnetic particle and specifically acting with the measurement object material; a detector configured to detect light passing through the substrate; and a controller configured to control the magnetic field applicator to perform a first operation to apply a first magnetic field in a direction to move the magnetic particle away from the substrate when a specimen solution containing the measurement object material is introduced into the measurement cartridge, and then perform a second operation to apply a second magnetic field in a direction to move the magnetic particle toward the substrate."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Specimen measurement device and control method of specimen measurement device","description":"A specimen measurement device which detects a measurement object material according to the present embodiment, includes: a magnetic field applicator configured to apply a magnetic field to a measureme","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11486831","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11486831","citation_suggestion":"Patentable. \"Specimen measurement device and control method of specimen measurement device\" (US-11486831). https://patentable.app/patents/US-11486831","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11486831","json":"https://patentable.app/api/llm-context/US-11486831","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T21:24:34.580Z"}