{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11486928","patent":{"patent_number":"US-11486928","title":"Electronic circuit and corresponding method of testing electronic circuits","assignee":null,"inventors":[],"filing_date":"2021-01-27T00:00:00.000Z","publication_date":"2022-11-01T00:00:00.000Z","cpc_codes":["G06F"],"num_claims":13,"abstract":"A combinational circuit block has input pins configured to receive input digital signals and output pins configured to provide output digital signals as a function of the input digital signals received. A test input pin receives a test input signal. A test output pin provides a test output signal as a function of the test input signal received. A set of scan registers are selectively coupled to either the combinational circuit block or to one another so as to form a scan chain of scan registers serially coupled between the test input pin and the test output pin. The scan registers in the set of scan registers are clocked by a clock signal. At least one input register is coupled between the test input pin and a first scan register of the scan chain. The at least one input register is clocked by an inverted replica of the clock signal."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Electronic circuit and corresponding method of testing electronic circuits","description":"A combinational circuit block has input pins configured to receive input digital signals and output pins configured to provide output digital signals as a function of the input digital signals receive","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11486928","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11486928","citation_suggestion":"Patentable. \"Electronic circuit and corresponding method of testing electronic circuits\" (US-11486928). https://patentable.app/patents/US-11486928","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11486928","json":"https://patentable.app/api/llm-context/US-11486928","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T13:23:21.528Z"}