{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11490028","patent":{"patent_number":"US-11490028","title":"Two-dimensional flicker measurement apparatus and two-dimensional flicker measurement method","assignee":null,"inventors":[],"filing_date":"2018-09-10T00:00:00.000Z","publication_date":"2022-11-01T00:00:00.000Z","cpc_codes":["H04N","G02F","G09G"],"num_claims":20,"abstract":"A two-dimensional flicker measurement apparatus includes: a first calculation unit that calculates a flicker amount of each of a plurality of measurement regions set on a measurement target based on a photometric quantity obtained by performing photometry in the measurement target at a first sampling frequency; a second calculation unit that calculates a flicker amount of a predetermined measurement region set on the measurement target based on a photometric quantity obtained by performing photometry in the predetermined measurement region at a second sampling frequency; and a correction unit that corrects the flicker amount of each of the plurality of measurement regions calculated by the first calculation unit using a correction coefficient defined by the flicker amount calculated by the second calculation unit and a flicker amount of the predetermined measurement region calculated based on a photometric quantity obtained by performing photometry in the predetermined measurement region at the first sampling frequency."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Two-dimensional flicker measurement apparatus and two-dimensional flicker measurement method","description":"A two-dimensional flicker measurement apparatus includes: a first calculation unit that calculates a flicker amount of each of a plurality of measurement regions set on a measurement target based on a","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11490028","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11490028","citation_suggestion":"Patentable. \"Two-dimensional flicker measurement apparatus and two-dimensional flicker measurement method\" (US-11490028). https://patentable.app/patents/US-11490028","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11490028","json":"https://patentable.app/api/llm-context/US-11490028","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T16:23:49.780Z"}