{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11493433","patent":{"patent_number":"US-11493433","title":"Normal incidence ellipsometer and method for measuring optical properties of sample by using same","assignee":null,"inventors":[],"filing_date":"2019-07-03T00:00:00.000Z","publication_date":"2022-11-08T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N"],"num_claims":21,"abstract":"The present invention relates to a normal incidence ellipsometer and a method for measuring the optical properties of a sample by using same. The purpose of the present invention is to provide: a normal incidence ellipsometer in which a wavelength-dependent compensator is replaced with a wavelength-independent linear polarizer such that equipment calibration procedures are simplified while a measurement wavelength range expansion can be easily implemented; and a method for measuring the optical properties of a sample by using same."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Normal incidence ellipsometer and method for measuring optical properties of sample by using same","description":"The present invention relates to a normal incidence ellipsometer and a method for measuring the optical properties of a sample by using same. The purpose of the present invention is to provide: a norm","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11493433","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11493433","citation_suggestion":"Patentable. \"Normal incidence ellipsometer and method for measuring optical properties of sample by using same\" (US-11493433). https://patentable.app/patents/US-11493433","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11493433","json":"https://patentable.app/api/llm-context/US-11493433","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T20:15:53.414Z"}