{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11493901","patent":{"patent_number":"US-11493901","title":"Detection of defect in edge device manufacturing by artificial intelligence","assignee":null,"inventors":[],"filing_date":"2020-09-24T00:00:00.000Z","publication_date":"2022-11-08T00:00:00.000Z","cpc_codes":["G05B","G06N","G05B","G05B","G05B"],"num_claims":17,"abstract":"An approach alerting users based on a detected defect during manufacturing quality inspection based on graphical images is disclosed. The approach initiates a device inspection, wherein a model controller collects metadata about a product to be inspected and select a first model with a highest score to identify defects in the device. The approach utilizes an API to obtain results from the inspection and after determining that another model is available, initiating the second model run via an edge device performing the inspection of the device. And the algorithm awaits a response in detecting a defect during either the first model run or the second model run, providing an alert detailing the defect detected in the device."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Detection of defect in edge device manufacturing by artificial intelligence","description":"An approach alerting users based on a detected defect during manufacturing quality inspection based on graphical images is disclosed. The approach initiates a device inspection, wherein a model contro","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11493901","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11493901","citation_suggestion":"Patentable. \"Detection of defect in edge device manufacturing by artificial intelligence\" (US-11493901). https://patentable.app/patents/US-11493901","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11493901","json":"https://patentable.app/api/llm-context/US-11493901","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T07:01:57.711Z"}