{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11494375","patent":{"patent_number":"US-11494375","title":"Method and apparatus for analyzing cause of product defect","assignee":null,"inventors":[],"filing_date":"2021-02-16T00:00:00.000Z","publication_date":"2022-11-08T00:00:00.000Z","cpc_codes":["G06F","G06F","G06Q"],"num_claims":6,"abstract":"Disclosed are a method and apparatus for analyzing a cause of a product defect. The apparatus includes a pre-processing unit configured to receive process data and perform pre-processing for analyzing a cause of a product defect, a search unit configured to search for a primary defect cause-conditional sentence to represent a primary defect cause through solution encoding and decoding and solution fitness calculation for a plurality of candidate solutions in order to search for a conditional sentence using the pre-processed process data and to output the primary defect cause-conditional sentence, and a post-processing unit configured to receive the primary defect cause-conditional sentence, remove a redundant conditional sentence, and output the final defect cause-conditional sentence."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method and apparatus for analyzing cause of product defect","description":"Disclosed are a method and apparatus for analyzing a cause of a product defect. The apparatus includes a pre-processing unit configured to receive process data and perform pre-processing for analyzing","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11494375","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11494375","citation_suggestion":"Patentable. \"Method and apparatus for analyzing cause of product defect\" (US-11494375). https://patentable.app/patents/US-11494375","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11494375","json":"https://patentable.app/api/llm-context/US-11494375","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T11:19:45.884Z"}