{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11495534","patent":{"patent_number":"US-11495534","title":"Semiconductor device with test pad and method for fabricating the same","assignee":null,"inventors":[],"filing_date":"2021-04-12T00:00:00.000Z","publication_date":"2022-11-08T00:00:00.000Z","cpc_codes":["H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L"],"num_claims":20,"abstract":"The present application discloses a semiconductor device and a method for fabricating the semiconductor device. The semiconductor device includes a substrate, a circuit layer positioned on the substrate and including a functional block positioned on the substrate, and a test pad positioned on the substrate and distal from the functional block, a redistribution structure positioned on the circuit layer and including a first conductive portion positioned over the functional block and electrically coupled to the functional block, and a second conductive portion positioned over the test pad and electrically coupled to the test pad, and a through semiconductor via physically and electrically coupled to the test pad."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor device with test pad and method for fabricating the same","description":"The present application discloses a semiconductor device and a method for fabricating the semiconductor device. The semiconductor device includes a substrate, a circuit layer positioned on the substra","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11495534","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11495534","citation_suggestion":"Patentable. \"Semiconductor device with test pad and method for fabricating the same\" (US-11495534). https://patentable.app/patents/US-11495534","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11495534","json":"https://patentable.app/api/llm-context/US-11495534","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T17:18:21.874Z"}