{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11499927","patent":{"patent_number":"US-11499927","title":"Analysis method and X-ray fluorescence analyzer","assignee":null,"inventors":[],"filing_date":"2021-03-24T00:00:00.000Z","publication_date":"2022-11-15T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N"],"num_claims":8,"abstract":"An analysis method using an X-ray fluorescence analyzer is provided in which an X-ray spectrum is acquired by detecting a secondary X-ray emitted from a specimen when the specimen is irradiated with a primary X-ray. The analysis method includes: acquiring a first X-ray spectrum obtained, with a take-off angle of the secondary X-ray being set as a first take-off angle; acquiring a second X-ray spectrum obtained, with a take-off angle of the secondary X-ray being set as a second take-off angle that is different from the first take-off angle; and obtaining information on an element in a depth direction of a specimen based on the first X-ray spectrum and the second X-ray spectrum."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Analysis method and X-ray fluorescence analyzer","description":"An analysis method using an X-ray fluorescence analyzer is provided in which an X-ray spectrum is acquired by detecting a secondary X-ray emitted from a specimen when the specimen is irradiated with a","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11499927","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11499927","citation_suggestion":"Patentable. \"Analysis method and X-ray fluorescence analyzer\" (US-11499927). https://patentable.app/patents/US-11499927","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11499927","json":"https://patentable.app/api/llm-context/US-11499927","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T01:58:59.643Z"}