{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11499968","patent":{"patent_number":"US-11499968","title":"Nanoparticle measurement device, analysis device, and analysis method","assignee":null,"inventors":[],"filing_date":"2019-02-25T00:00:00.000Z","publication_date":"2022-11-15T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N","G01N"],"num_claims":6,"abstract":"A nanoparticle measurement device includes a timing signal generation unit, a low-frequency component extraction unit, a low-frequency component calculation unit, a threshold correction unit, and a measurement unit. The timing signal generation unit generates timing signals. The low-frequency component extraction unit extracts low-frequency components according to the timing signals. The low-frequency component calculation unit calculates an interpolated low-frequency component in accordance with the low-frequency components. The threshold correction unit sets a corrected threshold in accordance with the interpolated low-frequency component. The measurement unit extracts and counts nanoparticle pulse signals from a light reception signal according to the timing signals and the corrected threshold."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Nanoparticle measurement device, analysis device, and analysis method","description":"A nanoparticle measurement device includes a timing signal generation unit, a low-frequency component extraction unit, a low-frequency component calculation unit, a threshold correction unit, and a me","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11499968","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11499968","citation_suggestion":"Patentable. \"Nanoparticle measurement device, analysis device, and analysis method\" (US-11499968). https://patentable.app/patents/US-11499968","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11499968","json":"https://patentable.app/api/llm-context/US-11499968","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T07:00:10.969Z"}