{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11500003","patent":{"patent_number":"US-11500003","title":"Integrated circuit and measurement method","assignee":null,"inventors":[],"filing_date":"2020-07-31T00:00:00.000Z","publication_date":"2022-11-15T00:00:00.000Z","cpc_codes":["G06K"],"num_claims":20,"abstract":"In accordance with a first aspect of the present disclosure, an integrated circuit is provided, comprising a current source and a reference capacitor, the integrated circuit being configured to: inject, using said current source, a first current in an external measurement capacitor and determine a first amount of time within which a resulting voltage on the measurement capacitor reaches a voltage threshold; inject, using said current source, a second current in the reference capacitor and determine a second amount of time within which a resulting voltage on the reference capacitor reaches said voltage threshold; detect a change of the capacitance on the measurement capacitor using a difference between the first amount of time and the second amount of time. In accordance with a second aspect of the present disclosure, a corresponding measurement method is conceived."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Integrated circuit and measurement method","description":"In accordance with a first aspect of the present disclosure, an integrated circuit is provided, comprising a current source and a reference capacitor, the integrated circuit being configured to: injec","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11500003","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11500003","citation_suggestion":"Patentable. \"Integrated circuit and measurement method\" (US-11500003). https://patentable.app/patents/US-11500003","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11500003","json":"https://patentable.app/api/llm-context/US-11500003","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T21:47:23.888Z"}