{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11500338","patent":{"patent_number":"US-11500338","title":"Test platform for embedded control system","assignee":null,"inventors":[],"filing_date":"2018-07-12T00:00:00.000Z","publication_date":"2022-11-15T00:00:00.000Z","cpc_codes":["G05B","G05B","G05B","G06F"],"num_claims":18,"abstract":"In an aspect, a test platform for testing an embedded control system having a plurality of interconnected components is operable to: receive, at run time, configuration data for configuring a system under test (“SUT”) representing the embedded control system, the configuration data specifying: which of the components shall be simulated versus hardware-in-the-loop (HIL) components in the SUT; and an inter-component signal mapping that maps input signals to output signals of the specified simulated or HIL components of the SUT; for each of the simulated or HIL components, automatically activate, at run time, a corresponding object code portion for simulating the embedded system component in the test platform or a corresponding object code portion for facilitating communication with the HIL component connected to the test platform, respectively; and automatically map input signals of the activated object code portions to output signals of the activated code portions according to the signal mapping."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Test platform for embedded control system","description":"In an aspect, a test platform for testing an embedded control system having a plurality of interconnected components is operable to: receive, at run time, configuration data for configuring a system u","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11500338","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11500338","citation_suggestion":"Patentable. \"Test platform for embedded control system\" (US-11500338). https://patentable.app/patents/US-11500338","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11500338","json":"https://patentable.app/api/llm-context/US-11500338","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T00:18:33.009Z"}