{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11500357","patent":{"patent_number":"US-11500357","title":"Measurement solution service providing system","assignee":null,"inventors":[],"filing_date":"2018-11-21T00:00:00.000Z","publication_date":"2022-11-15T00:00:00.000Z","cpc_codes":["G05B","G05B","G06N","G06Q","G16Y","G16Y","G16Y","G06N"],"num_claims":17,"abstract":"A computing system is configured to analyze both measurement data and indicator data as big data aggregated in measurement database and indicator database by deep learning for each lot of a part or for each lot of a finished product and a part pre-associated with each other, and also for each consolidation target between bases subordinate to the same start point corresponding to identification information that specifies a business user of the computing system. Analysis target layers by the deep learning are a three-layer serial hierarchical structure containing a production condition layer and an environment condition layer as a start point for analysis of a part layer, or a four-layer serial hierarchical structure containing a part layer, a production condition layer, and an environment condition layer as a start point for analysis of a finished product layer."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Measurement solution service providing system","description":"A computing system is configured to analyze both measurement data and indicator data as big data aggregated in measurement database and indicator database by deep learning for each lot of a part or fo","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11500357","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11500357","citation_suggestion":"Patentable. \"Measurement solution service providing system\" (US-11500357). https://patentable.app/patents/US-11500357","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11500357","json":"https://patentable.app/api/llm-context/US-11500357","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T23:04:57.420Z"}