{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11503171","patent":{"patent_number":"US-11503171","title":"Inspection system, inspection method, and inspection program","assignee":null,"inventors":[],"filing_date":"2022-01-12T00:00:00.000Z","publication_date":"2022-11-15T00:00:00.000Z","cpc_codes":["H04N","H04N","H04N","H04N"],"num_claims":21,"abstract":"An inspection system includes: an inspection part that compares a scanned image obtained by scanning a sheet on which an image is formed on the basis of a job with a reference image prepared in advance and thereby performs inspection of the scanned image; and a hardware processor that sets an inspection target page to be a target of inspection and a non-inspection target page to be excluded from inspection, for the job, wherein the hardware processor causes the inspection part to perform inspection for the inspection target page and not to perform inspection for the non-inspection target page on the basis of the setting of the hardware processor, and the hardware processor creates an inspection report including scanned images of all pages of the job including the non-inspection target page."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Inspection system, inspection method, and inspection program","description":"An inspection system includes: an inspection part that compares a scanned image obtained by scanning a sheet on which an image is formed on the basis of a job with a reference image prepared in advanc","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11503171","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11503171","citation_suggestion":"Patentable. \"Inspection system, inspection method, and inspection program\" (US-11503171). https://patentable.app/patents/US-11503171","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11503171","json":"https://patentable.app/api/llm-context/US-11503171","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T11:57:43.039Z"}