{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11506489","patent":{"patent_number":"US-11506489","title":"Contour accuracy measuring system and contour accuracy measuring method","assignee":null,"inventors":[],"filing_date":"2019-07-31T00:00:00.000Z","publication_date":"2022-11-22T00:00:00.000Z","cpc_codes":["G05B","G05B","G05B","G05B","G05B","G05B","G05B","G05B"],"num_claims":7,"abstract":"A contour accuracy measuring system and a contour accuracy measuring method are provided. The contour accuracy measuring system captures location coordinate data of shafts of a machine tool. The location coordinate data are calculated to obtain a first true round trajectory on an inclined plane as reference information. The contour accuracy measuring system then adjusts parameters of the locations of the shafts based on the location coordinate data of the shafts of the reference information to generate a second true round trajectory on the inclined plane, so as to get to know whether the locations of the shafts after the parameters are adjusted comply with a standard. Therefore, the overall measurement process can be speeded up by automatically measuring the parameters and automatically testing an operating status."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Contour accuracy measuring system and contour accuracy measuring method","description":"A contour accuracy measuring system and a contour accuracy measuring method are provided. The contour accuracy measuring system captures location coordinate data of shafts of a machine tool. The locat","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11506489","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11506489","citation_suggestion":"Patentable. \"Contour accuracy measuring system and contour accuracy measuring method\" (US-11506489). https://patentable.app/patents/US-11506489","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11506489","json":"https://patentable.app/api/llm-context/US-11506489","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T14:09:21.035Z"}