{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11506650","patent":{"patent_number":"US-11506650","title":"Method for automatic quantitative statistical distribution characterization of dendrite structures in a full view field of metal materials","assignee":null,"inventors":[],"filing_date":"2020-09-01T00:00:00.000Z","publication_date":"2022-11-22T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G06T","G06T","G06T","G06T"],"num_claims":12,"abstract":"The invention belongs to the technical field of quantitative statistical distribution analysis for micro-structures of metal materials, and relates to a method for automatic quantitative statistical distribution characterization of dendrite structures in a full view field of metal materials. According to the method based on deep learning in the present invention, dendrite structure feature maps are marked and trained to obtain a corresponding object detection model, so as to carry out automatic identification and marking of dendrite structure centers in a full view field; and in combination with an image processing method, feature parameters in the full view field such as morphology, position, number and spacing of all dendrite structures within a large range are obtained quickly, thereby achieving quantitative statistical distribution characterization of dendrite structures in the metal material. The method is accurate, automatic and efficient, involves a large amount of quantitative statistical distribution information, and is statistically more representative as compared with the traditional measurement of feature sizes of dendrite structures in a single view field."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for automatic quantitative statistical distribution characterization of dendrite structures in a full view field of metal materials","description":"The invention belongs to the technical field of quantitative statistical distribution analysis for micro-structures of metal materials, and relates to a method for automatic quantitative statistical d","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11506650","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11506650","citation_suggestion":"Patentable. \"Method for automatic quantitative statistical distribution characterization of dendrite structures in a full view field of metal materials\" (US-11506650). https://patentable.app/patents/US-11506650","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11506650","json":"https://patentable.app/api/llm-context/US-11506650","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T14:47:56.736Z"}