{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11507049","patent":{"patent_number":"US-11507049","title":"Method for detecting abnormity in unsupervised industrial system based on deep transfer learning","assignee":null,"inventors":[],"filing_date":"2019-11-12T00:00:00.000Z","publication_date":"2022-11-22T00:00:00.000Z","cpc_codes":["G05B","G05B","G06N","G06N","G06N","G05B"],"num_claims":19,"abstract":"The present invention discloses a method for detecting abnormity in an unsupervised industrial system based on deep transfer learning. Labeled machine sensor sequence data from a source domain and unlabeled sensor sequence data from a target domain are used in the present invention to train an industrial system abnormal detection model with good generalization ability, and the industrial system abnormal detection model is trained and tested to finally generate a trained industrial system abnormity discrimination model. Using the model, received machine sensor sequence data can be analyzed and whether a machine is abnormal is discriminated."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for detecting abnormity in unsupervised industrial system based on deep transfer learning","description":"The present invention discloses a method for detecting abnormity in an unsupervised industrial system based on deep transfer learning. Labeled machine sensor sequence data from a source domain and unl","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11507049","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11507049","citation_suggestion":"Patentable. \"Method for detecting abnormity in unsupervised industrial system based on deep transfer learning\" (US-11507049). https://patentable.app/patents/US-11507049","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11507049","json":"https://patentable.app/api/llm-context/US-11507049","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T20:36:55.305Z"}