{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11514316","patent":{"patent_number":"US-11514316","title":"Method and apparatus for inspecting defects in washer based on deep learning","assignee":null,"inventors":[],"filing_date":"2020-03-20T00:00:00.000Z","publication_date":"2022-11-29T00:00:00.000Z","cpc_codes":["G06N","G06N","G06N","G06N","G06Q","H04W"],"num_claims":20,"abstract":"Disclosed is a method and apparatus for inspecting defects in a washer based on deep learning. According to an embodiment of the present disclosure, a method for inspecting defects in a washer based on deep learning gathers learning data while the washer operates and trains a first ANN model for diagnosing the condition of the washer and a second ANN model for securing the reliability of the result of inspection of the condition of the washer. Thereafter, the washer may make a diagnosis of whether the washer is defective based on the two pre-trained ANN models and are thereby able to continuously monitor whether the washer has an abnormal condition. According to an embodiment, the artificial intelligence (AI) module may be related to unmanned aerial vehicles (UAVs), robots, augmented reality (AR) devices, virtual reality (VR) devices, and 5G service-related devices."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method and apparatus for inspecting defects in washer based on deep learning","description":"Disclosed is a method and apparatus for inspecting defects in a washer based on deep learning. According to an embodiment of the present disclosure, a method for inspecting defects in a washer based o","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11514316","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11514316","citation_suggestion":"Patentable. \"Method and apparatus for inspecting defects in washer based on deep learning\" (US-11514316). https://patentable.app/patents/US-11514316","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11514316","json":"https://patentable.app/api/llm-context/US-11514316","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T14:37:25.478Z"}