{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11514357","patent":{"patent_number":"US-11514357","title":"Nuisance mining for novel defect discovery","assignee":null,"inventors":[],"filing_date":"2019-02-15T00:00:00.000Z","publication_date":"2022-11-29T00:00:00.000Z","cpc_codes":["G06N","G01N","G01N","G01N","G01N","G06N","G06N"],"num_claims":20,"abstract":"A method of defect discovery can include providing a nuisance bin in a nuisance filter, partitioning the defect population into a defect population partition, segmenting the defect population partition into a defect population segment, selecting from the defect population segment a selected set of defects, computing one or more statistics of the signal attributes of the defects in the defect population segment, replicating the selected set of defects to yield generated defects, shifting the generated defects outside of the defect population segment, creating a training set, and training a binary classifier. This method can be operated on a system. The method can enable a semiconductor manufacturer to determine more accurately the presence of defects that would otherwise have gone unnoticed."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Nuisance mining for novel defect discovery","description":"A method of defect discovery can include providing a nuisance bin in a nuisance filter, partitioning the defect population into a defect population partition, segmenting the defect population partitio","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11514357","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11514357","citation_suggestion":"Patentable. \"Nuisance mining for novel defect discovery\" (US-11514357). https://patentable.app/patents/US-11514357","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11514357","json":"https://patentable.app/api/llm-context/US-11514357","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T22:39:32.225Z"}