{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11514586","patent":{"patent_number":"US-11514586","title":"Automated application of drift correction to sample studied under electron microscope","assignee":null,"inventors":[],"filing_date":"2022-08-03T00:00:00.000Z","publication_date":"2022-11-29T00:00:00.000Z","cpc_codes":["G06T","H04N","G06T","G06T","H04N","H04N","G06T"],"num_claims":25,"abstract":"Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Automated application of drift correction to sample studied under electron microscope","description":"Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11514586","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11514586","citation_suggestion":"Patentable. \"Automated application of drift correction to sample studied under electron microscope\" (US-11514586). https://patentable.app/patents/US-11514586","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11514586","json":"https://patentable.app/api/llm-context/US-11514586","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T20:34:51.304Z"}