{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11520507","patent":{"patent_number":"US-11520507","title":"System and method for test precondition generation based on factory-formatted state of memory device","assignee":null,"inventors":[],"filing_date":"2021-08-19T00:00:00.000Z","publication_date":"2022-12-06T00:00:00.000Z","cpc_codes":["G06F","G06F","G06F","G06F","G06F","G06F","G06F"],"num_claims":20,"abstract":"A system and associated method for generating a test precondition. The system includes a test device and a storage device including user data blocks and system blocks. The test device reads, from the system blocks, an initial system data snapshot stored and represents a factory format; erases the system blocks and the user data blocks; writes data to selected user data blocks; generates system tables associated with the erasing and writing of the selected user data blocks; replaces the initial system data snapshot with the system tables; writes the replaced system tables to the system blocks; and performs one or more tests on the storage device."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"System and method for test precondition generation based on factory-formatted state of memory device","description":"A system and associated method for generating a test precondition. The system includes a test device and a storage device including user data blocks and system blocks. The test device reads, from the ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11520507","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11520507","citation_suggestion":"Patentable. \"System and method for test precondition generation based on factory-formatted state of memory device\" (US-11520507). https://patentable.app/patents/US-11520507","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11520507","json":"https://patentable.app/api/llm-context/US-11520507","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T17:05:50.132Z"}