{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11521120","patent":{"patent_number":"US-11521120","title":"Inspection apparatus and machine learning method","assignee":null,"inventors":[],"filing_date":"2019-09-11T00:00:00.000Z","publication_date":"2022-12-06T00:00:00.000Z","cpc_codes":["G06N","G06N","G06N"],"num_claims":14,"abstract":"An inspection apparatus of the present disclosure includes: a machine learning device that performs machine learning on a basis of state data acquired from an inspection target and label data indicating an inspection result related to the inspection target to generate a learning model; a learning model evaluation index calculation unit that calculates a learning model evaluation index related to the learning model generated by the machine learning device as an evaluation index to be used to evaluate the learning model; an inspection index acquisition unit that acquires an inspection index to be used in the inspection; and a learning model selection unit that displays the learning model evaluation index and the inspection index so as to be comparable with each other regarding the learning model generated by the machine learning device, receives selection of the learning model by an operator, and outputs a result of the selection."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Inspection apparatus and machine learning method","description":"An inspection apparatus of the present disclosure includes: a machine learning device that performs machine learning on a basis of state data acquired from an inspection target and label data indicati","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11521120","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11521120","citation_suggestion":"Patentable. \"Inspection apparatus and machine learning method\" (US-11521120). https://patentable.app/patents/US-11521120","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11521120","json":"https://patentable.app/api/llm-context/US-11521120","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T00:41:23.901Z"}