{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11525858","patent":{"patent_number":"US-11525858","title":"Method and system for predictive maintenance of integrated circuits","assignee":null,"inventors":[],"filing_date":"2018-07-18T00:00:00.000Z","publication_date":"2022-12-13T00:00:00.000Z","cpc_codes":["G06F","G06F"],"num_claims":18,"abstract":"A system and method for the predictive maintenance of electronic components that includes sensors at at least one position via which present values of system parameters, such as temperature and voltage, and a signal propagation time at the at least one position are determined, where values of the system parameters and the signal propagation time presently determined by the sensors are retrieved by a central monitoring unit, an individual valid limit value is determined for the signal propagation time at each of the at least one position via the central monitoring unit based on the presently determined values of the system parameters, and the presently determined signal propagation time at each of the at least one position is compared with the associated valid limit value, and a notification is sent to a superordinate level, if the signal propagation time exceeds the limit value to trigger replacement of the electronic component."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method and system for predictive maintenance of integrated circuits","description":"A system and method for the predictive maintenance of electronic components that includes sensors at at least one position via which present values of system parameters, such as temperature and voltag","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11525858","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11525858","citation_suggestion":"Patentable. \"Method and system for predictive maintenance of integrated circuits\" (US-11525858). https://patentable.app/patents/US-11525858","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11525858","json":"https://patentable.app/api/llm-context/US-11525858","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T13:17:07.175Z"}