{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11526979","patent":{"patent_number":"US-11526979","title":"Method of defect classification and system thereof","assignee":null,"inventors":[],"filing_date":"2020-08-14T00:00:00.000Z","publication_date":"2022-12-13T00:00:00.000Z","cpc_codes":["G06T","G06F","G06F","G06F","G06F","G06T","G06V","G06V","G06V","G06T","G06T","G06T","G06T"],"num_claims":20,"abstract":"There are provided system and method of classifying defects in a specimen. The method includes: obtaining one or more defect clusters detected on a defect map of the specimen, each cluster characterized by a set of cluster attributes comprising spatial attributes including spatial density indicative of density of defects in one or more regions accommodating the cluster, each given defect cluster being detected at least based on the spatial density thereof meeting a criterion. The defect map also comprises non-clustered defects. Defects of interest (DOI) are identified in each cluster by performing respective defect filtrations for each cluster and non-clustered defects."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method of defect classification and system thereof","description":"There are provided system and method of classifying defects in a specimen. The method includes: obtaining one or more defect clusters detected on a defect map of the specimen, each cluster characteriz","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11526979","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11526979","citation_suggestion":"Patentable. \"Method of defect classification and system thereof\" (US-11526979). https://patentable.app/patents/US-11526979","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11526979","json":"https://patentable.app/api/llm-context/US-11526979","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T10:31:57.641Z"}