{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11531064","patent":{"patent_number":"US-11531064","title":"Method for testing a digital electronic circuit to be tested, corresponding test system and computer program product","assignee":null,"inventors":[],"filing_date":"2021-10-29T00:00:00.000Z","publication_date":"2022-12-20T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C"],"num_claims":18,"abstract":"In an embodiment a method for testing a digital electronic circuit includes coupling an external test equipment to a digital electronic circuit in order to apply an external voltage signal to the digital electronic circuit when an automatic test pattern generation (ATPG) procedure with a given test pattern is performed, wherein a value of the external voltage signal is controlled by the external test equipment and measuring, at the external test equipment, the digital supply voltage at an output of the voltage regulator and at an input of the internal digital circuitry, wherein the external voltage signal is applied to the differential inputs of the op-amp voltage regulator through an adaptation circuit to obtain determined values of the digital supply voltage."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for testing a digital electronic circuit to be tested, corresponding test system and computer program product","description":"In an embodiment a method for testing a digital electronic circuit includes coupling an external test equipment to a digital electronic circuit in order to apply an external voltage signal to the digi","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11531064","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11531064","citation_suggestion":"Patentable. \"Method for testing a digital electronic circuit to be tested, corresponding test system and computer program product\" (US-11531064). https://patentable.app/patents/US-11531064","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11531064","json":"https://patentable.app/api/llm-context/US-11531064","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T19:44:50.428Z"}