{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11532760","patent":{"patent_number":"US-11532760","title":"Device for in-situ fabrication process monitoring and feedback control of an electron beam additive manufacturing process","assignee":null,"inventors":[],"filing_date":"2018-05-21T00:00:00.000Z","publication_date":"2022-12-20T00:00:00.000Z","cpc_codes":["B33Y","G01N","B33Y","B33Y","B33Y","G01N"],"num_claims":21,"abstract":"A High Energy Beam Processing (HEBP) system provides feedback signal monitoring and feedback control for the improvement of process repeatability and three-dimensional (3D) printed part quality. Signals reflecting process parameters and the quality of the fabricated parts are analyzed by monitoring feedback signals from artifact sources with a process controller which adjusts process parameters. In this manner, fabricated parts are produced more accurately and consistently from powder feedstock by compensating for process variation in response to feedback signals."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Device for in-situ fabrication process monitoring and feedback control of an electron beam additive manufacturing process","description":"A High Energy Beam Processing (HEBP) system provides feedback signal monitoring and feedback control for the improvement of process repeatability and three-dimensional (3D) printed part quality. Signa","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11532760","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11532760","citation_suggestion":"Patentable. \"Device for in-situ fabrication process monitoring and feedback control of an electron beam additive manufacturing process\" (US-11532760). https://patentable.app/patents/US-11532760","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11532760","json":"https://patentable.app/api/llm-context/US-11532760","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T12:26:05.634Z"}