{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11940889","patent":{"patent_number":"US-11940889","title":"Combined TDECQ measurement and transmitter tuning using machine learning","assignee":null,"inventors":[],"filing_date":"2022-07-29T00:00:00.000Z","publication_date":"2024-03-26T00:00:00.000Z","cpc_codes":["G06F","G06N","G06F","G06F","H04B"],"num_claims":20,"abstract":"A test and measurement system has a test and measurement instrument, a test automation platform, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to receive a waveform created by operation of a device under test, generate one or more tensor arrays, apply machine learning to a first tensor array of the one or more tensor arrays to produce equalizer tap values, apply machine learning to a second tensor array of the one of the one or more tensor arrays to produce predicted tuning parameters for the device under test, use the equalizer tap values to produce a Transmitter and Dispersion Eye Closure Quaternary (TDECQ) value, and provide the TDECQ value and the predicted tuning parameters to the test automation platform. A method of testing devices under test includes receiving a waveform created by operation of a device under test, generating one or more tensor arrays, applying machine learning to a first tensor array of the one or more tensor arrays to produce equalizer tap values, applying machine learning to a second tensor array of the one or more tensor arrays to produce predicted tuning parameters for the device under test, using the equalizer tap values to produce a Transmitter Dispersion Eye Closure Quaternary (TDECQ) value, and providing the TDECQ value and the predicted tuning parameters to a test automation platform."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Combined TDECQ measurement and transmitter tuning using machine learning","description":"A test and measurement system has a test and measurement instrument, a test automation platform, and one or more processors, the one or more processors configured to execute code that causes the one o","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11940889","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11940889","citation_suggestion":"Patentable. \"Combined TDECQ measurement and transmitter tuning using machine learning\" (US-11940889). https://patentable.app/patents/US-11940889","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11940889","json":"https://patentable.app/api/llm-context/US-11940889","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T12:37:10.099Z"}