{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11941568","patent":{"patent_number":"US-11941568","title":"Method for quality monitoring of additive manufacturing processes","assignee":null,"inventors":[],"filing_date":"2022-02-24T00:00:00.000Z","publication_date":"2024-03-26T00:00:00.000Z","cpc_codes":["G06Q","B33Y","G06F","G06F","G06F","G06Q","B33Y","B33Y","B33Y","B33Y","G05B"],"num_claims":20,"abstract":"A method for quality control monitoring of additive manufacturing processes comprising forming at least one channel in an additive manufacturing build platform, wherein the channel is formed in the upper surface of the build platform to a predetermined depth, and wherein the channel is formed in a predetermined pattern across the upper surface of the build platform; placing a sensor in the channel formed in the upper surface of the build platform, wherein the sensor gathers information relevant to an additive manufacturing process occurring on or in close proximity to the build platform; enclosing the sensor within the channel formed in the upper surface of the build platform with an additive manufacturing substrate, wherein components or parts are built directly on the substrate using an additive manufacturing process, and using the sensor to gather information about the components or parts and the additive manufacturing process itself."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for quality monitoring of additive manufacturing processes","description":"A method for quality control monitoring of additive manufacturing processes comprising forming at least one channel in an additive manufacturing build platform, wherein the channel is formed in the up","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11941568","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11941568","citation_suggestion":"Patentable. \"Method for quality monitoring of additive manufacturing processes\" (US-11941568). https://patentable.app/patents/US-11941568","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11941568","json":"https://patentable.app/api/llm-context/US-11941568","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T12:45:41.472Z"}