{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11942379","patent":{"patent_number":"US-11942379","title":"Inspection method for detecting a defective bonding interface in a sample substrate, and measurement system implementing the method","assignee":null,"inventors":[],"filing_date":"2023-07-26T00:00:00.000Z","publication_date":"2024-03-26T00:00:00.000Z","cpc_codes":["G01N","H01L","G01N","G01N","G01N","G01N","H01L","G01N","G01N","G01N"],"num_claims":16,"abstract":"A measurement system and an inspection method for detecting a defective bonding interface in a sample substrate including at least one element disposed on a support. The method comprises: placing the sample substrate in the measurement system, establishing an inclination map of the exposed surface, analyzing the inclination map and identifying a zone or zones of the exposed surface whose inclinations deviate by more than a given threshold from the inclination of the reference surface; and detecting the presence of a defective bond between the element and the support, depending on the result of the analysis of the inclination map."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Inspection method for detecting a defective bonding interface in a sample substrate, and measurement system implementing the method","description":"A measurement system and an inspection method for detecting a defective bonding interface in a sample substrate including at least one element disposed on a support. The method comprises: placing the ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11942379","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11942379","citation_suggestion":"Patentable. \"Inspection method for detecting a defective bonding interface in a sample substrate, and measurement system implementing the method\" (US-11942379). https://patentable.app/patents/US-11942379","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11942379","json":"https://patentable.app/api/llm-context/US-11942379","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T11:40:59.037Z"}