{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11947001","patent":{"patent_number":"US-11947001","title":"Measurement setup, reference reflector as well as method for measuring attenuation","assignee":null,"inventors":[],"filing_date":"2021-02-18T00:00:00.000Z","publication_date":"2024-04-02T00:00:00.000Z","cpc_codes":["G01S","G01S","G01S","G01S","G06T","G01S","G01S"],"num_claims":20,"abstract":"A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup includes a positioning system, a reference reflector, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Measurement setup, reference reflector as well as method for measuring attenuation","description":"A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup includes a positioning system, a reference reflector, and a three ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11947001","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11947001","citation_suggestion":"Patentable. \"Measurement setup, reference reflector as well as method for measuring attenuation\" (US-11947001). https://patentable.app/patents/US-11947001","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11947001","json":"https://patentable.app/api/llm-context/US-11947001","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T10:39:01.279Z"}