{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11947890","patent":{"patent_number":"US-11947890","title":"Implementation of deep neural networks for testing and quality control in the production of memory devices","assignee":null,"inventors":[],"filing_date":"2020-05-08T00:00:00.000Z","publication_date":"2024-04-02T00:00:00.000Z","cpc_codes":["G06F","G06N","G06N","G06N","G06N","G06N","G06N","H01L","G06F"],"num_claims":20,"abstract":"Techniques are presented for the application of neural networks to the fabrication of integrated circuits and electronic devices, where example are given for the fabrication of non-volatile memory circuits and the mounting of circuit components on the printed circuit board of a solid state drive (SSD). The techniques include the generation of high precision masks suitable for analyzing electron microscope images of feature of integrated circuits and of handling the training of the neural network when the available training data set is sparse through use of a generative adversary network (GAN)."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Implementation of deep neural networks for testing and quality control in the production of memory devices","description":"Techniques are presented for the application of neural networks to the fabrication of integrated circuits and electronic devices, where example are given for the fabrication of non-volatile memory cir","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11947890","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11947890","citation_suggestion":"Patentable. \"Implementation of deep neural networks for testing and quality control in the production of memory devices\" (US-11947890). https://patentable.app/patents/US-11947890","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11947890","json":"https://patentable.app/api/llm-context/US-11947890","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T01:32:38.220Z"}